Xiaoyan Han
Professor, Electrical and Computer Engineering
Contact
- 313-577-3646
- ac2487@wayne.edu
- Homepage URL
Xiaoyan Han
Professor, Electrical and Computer Engineering
Biography
Xiaoyan Han is a world-renowned expert in the field of Infrared Imaging and Nondestructive Evaluation (NDE). Her discovery of scientific phenomena of acoustic chaos, the nonlinearity of acoustic wave in coupling in materials was a significant contribution to the scientific community for advances in the theoretical and practical understanding of sonic thermography needed to underpin the application of the technology. Her algorithm and approach of material loss measurement through infrared imaging was five to ten times better in accuracy compare to the traditional methods, and allowed a breakthrough for fast and wide-area materials characterization. Boeing Designated Engineering Representative (DER) made her IR Imaging procedure for bonded fuselage doublers the approved method necessary to terminate repeat inspections of fuselage. Her research breakthrough was highlighted in "Science and Innovation" featured on "research.gov" to reflect the outcomes of the important results and impacts from her research. She received the prestigious The Technical Cooperation Program (TTCP) Achievement Award of Department of Defense (DOD) at the Pentagon Hall of Heroes. She also received the Airlines for America - Federal Aviation Administration (A4A-FAA) "Better Way Award", which recognize her significant contribution to national public aviation safety. Professor Han was interviewed and filmed by both Fox 2 News and ABC channel 7 on her research on Infrared Imaging technologies. Professor Han has received over $11 M in research funding during her career, and recently she received the highly competitive SBIR phase I and phase II awards from the DOD's Missile Defense Agency (MDA) to commercialize her innovative technology on "A Portable Thermosonic Imaging System for Rapid, Full-field Nondestructive Testing of Advanced Materials".
Research Interests
Infrared imaging, nondestructive evaluations